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IAR SYSTEMS I-jet - Page 29

IAR SYSTEMS I-jet
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AFE1_AFE2-1:1
I-jet
29
These are the pin definitions for the ADA-MIPI20-TI14 adapter:
Pin
I-jet
direction
Name Description
nTRST Output Test Logic
Reset
Active LOW signal that causes all test and debug
logic in the device to be reset along with the IEEE
1149.1 TAP.
TCK Output Test Clock This is the test clock used for driving the IEEE
1149.1 TAP state machine and logic.
TMS Output Test Mode
Select
Directs the next state of the IEEE 1149.1 TAP state
machine.
TDI Output Test Data Input IEEE 1149.1 scan data input to the device.
TDO Input Test Data
Output
IEEE 1149.1 scan data output from the device.
RTCK Input TCK Return Used only in Adaptive Clocking mode. I-jet
monitors RTCK to determine when to send the
next TCK.
PD Input Power Detect Should be ties to the I/O voltage of the target
device. Used by I-jet to detect whether target
power is active and to set the JTAG signal voltage
reference for level translators.
EMU0 I/O Emulation 0 Depending on the device, EMU pins support boot
modes and other features. I-jet does not use this
pin but it is routed to the TRACEDATA[2] pin on
the MIPI20 connector. For proper booting, this pin
should be pulled up on the target.
EMU1 I/O Emulation 1 Depending on the device, EMU pins support boot
modes and other features. I-jet does not use this
pin but it is routed to the TRACEDATA[3] pin on
the MIPI20 connector. For proper booting, this pin
should be pulled up on the target.
Table 10: ADA-MIPI20-TI14 adapter pin definitions