IBM 3278 Series

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Test Pattern for Model 1:
Line 1
Line 2
Ae I olllU5)iaee louudie·, riuae i ouae; 6unA~ iOtJAOYAEE IOUYCAifit:iUAEiOUAEiOONabcdehh i jk I mnop
~rstuvwxyza~6~r*ABcDEFGHIJKLMNOPQRSTUVWXYz~sAC;*O'2i45b7><[])(}{ ='''/'1 :7!S4t¥~~
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Op Inf Area
oi23"i~i> < [ 1) () { ='" /, I : ? I $¢£¥P.~012345b78qB§ue~_II.-. ,: +~-. VA~·" , ,
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Test Pattern for Models 2, ~~~,.~n~,~:, ,_ ,~.~, -0 ............ '0" .J.',," ,_ V
Line 1 ~e'ouae'ouae'ounA~luUA YAEEIOUYCAEIOUAEI UA~luUNabcdefghijklmnop~r5tuvwxyz~~acr*
Line 2 ABCDEFGHIJKLMNOPQRSTUVWXYZ~SAC;*oiijii~i><[])(}{ ='"/'1 :?'$¢£¥~~012345b78qB§u@~_
~: -------.. ~ =
Op Inf Area
~Tii45b7><[])(}{ ='''/'I:?!$4£¥~~012345b78qB§.@X_&- .• :+--···-·'·.Ae,ou!a)iAeelouUc
::: Figure 3-1. Test Patterns
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