IBM 3278 Series

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Test Pattern for Model 1:
Line 1
Line
2
Op In! Nea
7.(~.l;ttJ*?"J.,~~t~9'f·)" ~t:iI:~/J)t7"*": 4)'f1'13"JII"0.,:;,,"·. r ... , • 'H" XlI,. H7 -llabcdef gh i jk I mnop
q,rstuvwxyz..,4,1iABCOEFGHIJKLMNOPQRSTUVWXYZtUIAC;*o,23<;sb7><[]) () { =' "/', : ?!S4t¥I\J(
== =
6, 23<;o5b7 > < [ 1 ) ( ) ( ='" /'- I : ? , $¢t¥r.~01 2345b 7 Sqf.l§"@%_I!.- • , : + ~-o v A_'" , ,
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(Divider
Line)
!,")T ~t:iI:~/J)t7"*": 4)'f1'13"JII"0.,;,," 0 0 r ... , "H"IlI "13., -llabcdef II'h i jk I mnopq,r 5 tuvwxyz •• 4,1i1i 1/
ABCDEFGHIJKLMNOPQRSTUVWXYZ~0AC;*O'2345bT><[])(){ ="'/" i?!$¢£¥~~012345b789B§·@Y.-
Test Pattern for Models 2, 3, 4, and 5:
Line 1
Line 2
: =
Op In! Area 'O'!"'i345b7)( []) () { ='" /,' i? I $¢£¥M{01234Sb78qB§.@~C&-.,: +~-. VA~"" ,i'1"JHtJ*?"::J'1;,~t')SI
~ Figure 3-3. Japanese English Test Patterns
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