16-1  Section 16 Failures and After-Sale Services 
 
 
 
 
 
Section 16 Failures and After-Sale 
Services 
16.1  Failure Detection 
Semiconductor circuits can be considered to be almost free from defective semiconductors and/or 
performance deterioration except when there are design and inspection errors, or external and human 
induced causes. Generally, the causes of comparably frequent failures include line disconnection due 
to humidity of the high resistor, failure of the variable resistor as well as contact failures of switches and 
relays. 
In addition to faulty parts, faulty adjustments (especially faulty tuning) or faulty maintenance (especially 
faulty cable contact) occasionally make up causes of failures; thus, it is effective to reinspect or 
readjust these items. 
 
 
16.1.1  About alerts 
Failures can be detected from alerts. 
For details on alerts, please refer to "Appendix B, Alert List." 
 
16.1.2  Alert description 
For a description of alerts to be displayed, please refer to "Appendix B, Alert List." 
 
16.1.3  Fuse inspection 
Because there is a specific cause for any fuse meltdown, it is necessary to check the related circuits 
even if there is no abnormality after changing a fuse. However, please give consideration that the fuse 
meltdown characteristics vary significantly. The following table shows a list of the fuses used in this 
unit. 
List of Fuses Used 
 
Radar processing unit 
(JMR-5410-4X/6X/6XH) 
F2  5A 
Input/output circuit 
(CMH-2452) 
ST4-5AN1 
F3  10A  ST6-10AN1 
Radar processing unit 
(JMR-5425-7X/9X/6XH, 
JMR-5430-S, JMR-5472-S, 
F2  10A 
Input/output circuit 
(CMH-2452) 
PC4401 
ST6-10AN1 
F3  10A  ST6-10AN1