Keithley 2001 Repair Manual

Troubleshooting
2-5
405 Series
405.1
405.2
405.3
405.4
405.5
405.6
405.7
405.8
Absolute Value (x10 Gain):
Gain Comparison (Large
+DAC Output)
Gain Comparison (Large
+DAC Output)
Gain Comparison (Small
+DAC Output)
Gain Comparison (Small
+DAC Output)
Gain Comparison (Small
-DAC Output)
Gain Comparison (Small
-DAC Output)
Gain Comparison (Large
-DAC Output)
Gain Comparison (Large
-DAC Output)
406 Series
406.1
406.2
406.3
406.4
406.5
406.6
Test Buffer:
Measure DAC Output (for
test 406.6)
Test Buffer Output (-1.13V)
Read Test Buffer (for test
406.6)
Read DAC Output (for test
406.6)
Test Buffer Output (-0.01V)
Voltage Comparisons
407 Series
407.1
407.2
407.3
Front End:
2V Range
200V Range
750V Range
408 Series
408.1
408.2
408.3
408.4
408.5
408.6
/200 Correction Factor:
Circuit Setup (for next test)
Signal Stored (for next test)
Setup (for test 408.5) and
Measurement (for test
408.6)
Same as Test 408.3 but no
measurement.
Signal Stored (for next test)
Signal Comparisons
Table 2-1 (cont.)
Built-in-test summary
Test Circuit tested/exercised
Typical Way To Use BUILT-IN-TEST
1. Run the AUTOMATIC Built-In-Test as explained in
paragraph 2.5.1 and note the Þrst (lowest num-
bered) test that has failed. You should always ad-
dress the lowest numbered test failure Þrst because
that failure could cause subsequent tests to fail.
2. Familiarize yourself with the failed circuit. Docu-
mentation for the Built-In Tests are provided in
paragraph 2.10.3. Be sure to read the documenta-
tion for the complete series. For example, if test
200.4 fails, read the documentation for all 200 se-
ries tests (200.1 through 200.7). Note that the docu-
mentation directs you to the appropriate
schematic(s) for the circuit.
3. Manually run the test that failed as explained in
paragraph 2.5.2. Keep in mind that many of the
pass/fail type tests require that one or more circuit
exercise tests be run Þrst. Using the manual step
looping mode will ÒfreezeÓ instrument operation
after a test is run.
4. After manually running the test, use the test docu-
mentation and your troubleshooting expertise to
locate the problem.
409 Series
409.1
409.2
409.3
409.4
409.5
409.6
/750 Correction Factor:
Circuit Setup (for next test)
Signal Stored (for next test)
Setup (for test 409.5) and
Measurement (for test
409.6)
Same as Test 409.3 but no
measurement.
Signal Stored (for next test)
Signal Comparisons
410 Series
410.1
Converter:
TRMS Converter
411 Series
411.1
411.2
Filters:
TRMS Filter
Variable Gain AmpliÞer
Filter
412 Series
412.1
Switching:
AC Amps Switch
Table 2-1 (cont.)
Built-in-test summary
Test Circuit tested/exercised

Keithley 2001 Specifications

General

Model	2001
Category	Multimeter
Manufacturer	Keithley
Type	Digital Multimeter
Digits of Resolution	7.5
DC Voltage Range	100 mV to 1000 V
AC Voltage Range	100 mV to 750 V
Frequency Range	3 Hz to 500 kHz
Connectivity	GPIB, RS-232
Display	VFD
Resistance Accuracy	0.008% + 2.0 mΩ
Frequency Accuracy	±0.01%
DC Current Range	10 μA to 3 A
AC Current Range	10 μA to 3 A
Power Supply	100 V to 240 V AC, 45 Hz to 66 Hz