MIT MIT-SCAN-T3 - Measuring Method

Instruction Manual MIT-SCAN-T3 Version 02/2021
Page 8
1.1 Measuring method
Electromagnetic layer thickness measurement with MIT-SCAN-T3 is
based on pulse induction technology. The method requires reflectors to
act as antipoles at the base of the layer being measured (s. section
1.2, p. 9).
The MIT-SCAN-T3 measuring probe is equipped with an emission coil
and four sensors (s. Fig. 2 Emission field).
The emission coil emits a magnetic field at regular intervals. This field
induces a current in the installed antipole (s. Fig. 3 Induced current).
As it subsides temporally, a response field is generated (s. Fig. 4
Response field) which in turn is recorded by the four sensors and
evaluated by the device.
During a measurement run over a reflector, up to 200 pulses are
emitted and signals recorded. This data quantity ensures the high
reliability of the measuring method.
Fig. 4 Response field
Fig. 2 Emission field
Fig. 3 Induced current