Instruction Manual MIT-SCAN-T3 Version 02/2021
Enter data in each row by pressing the key. Press the key
again to confirm the data input in the activated row.
Entering information about measuring sites makes it easier to
identify measuring sites during evaluation with MIT Project
Software. After the input is completed, press the key for
about 3 seconds to go back to the measurement menu.
As long as a measurement has not yet been performed, layer
and reflector data can be changed or corrected at any time.
3.2.1 Layer system
MIT-SCAN-T3 is able to measure 2 and 3-layer systems.
Switching between layered systems is done by pressing and
subsequent selection with and
• 2-layer system: S, SB, B
• 3-layer system: S, SM, SMB, M, MB, B
A schematic representation of the selected layer (S = Surface,
M = Medium, B = Base) is shown in the right area of the screen (s.
Fig. 23).
Changing values:
1. Select parameters with
or and confirm with
2. Change cursor position
with or
3. Change values with
or
4. Accept selection with
Fig. 23 Selection of layer to
be measured
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