/'
6.
HOW
TO
USE EACH FUNCTION
M6LSEC-A
Available memory
6.7.2
Changing the current values
of
T,
C,
D,
W,
R,
A,
2,
or
V
by
list
monitoring
(Changlng current values
of
word
devices)
This operation changes the current value
of
a word device forcibly by desig-
nating a device and a device number.
[Basic operation]
SHIFT TEST
H
number Step
Hz+,---
.I-
New
decimal value (1 6 bits)
HF1-1
ew
hexadecimal value (16 bits)w
GO
1
I
UIL
New
decimal value
(32
bits)
GO+
.-I
u
1L
%New
hexadecimal value
(32
bits)mTb
.A-'
Device
fl
::ltzr
bFm
New
decimal value (16 bits)
HT1-1
Device
::l:zr
bFmNew
hexadecimal value (16 bits)HT}-I
Device
,"U",:zr
l-f=m
New
decimal value
(32
bits)
mzb
Device
::l:zr
b7MN.w
hexadecimal value
(32
bits)mTk
[Sample operatlon]
'7
The device
at the cursor
*"[ested. position is
]
...
nated device
(*
is
desig-
tested.
1
The current value of device "Dl" at the cursor position is changed
to
"K90",
and the current value of designated device "D100" is changed
to
"HFO(K240)"
Select the TEST mode, read the step
whose device
is
to be tested, and
change the current value
of
the de-
vice at the cursor position.
GO
26
LDI
@@
0
0
SP
x90
Change the current value
of
the de-
vice at the cursor position.
IT
21
MOV
1
1'
21)
DI
go}-
Change the current value
of
'Dl'
to
26
LDI
UT1
"K90'.
I
21)
DI
90
Change the current value
of
the des-
Dl00
RFO
ignated device.
The current value
of
'D100'
has
now
been changed to
'HFO(K240)'.
6-49
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