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NEC FD1165 - 5.2 Head Unload Delay

NEC FD1165
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5.1.1
Auto
Tap
Test
The
auto
tap
test
consists
of
a
head
load/head
unload
action.
To
initiate
the
auto
tap
test,
use
the
following
procedure.
a.
Turn
off
the
power
to
the
disk
drive.
b.
Connect
diagnostic
pin
T2
to
the
center
pin.
c.
Select
head
load
jumper
position
HL2
and
connect
HL2
to
ground.
d.
Turn
on
the
power
to
the
disk
drive
to
start
the
auto
tap
test.
5~1.2
Auto
Seek
Test
The
auto
seek
test
consists
of
a
continuous
track
seek,
from
tr
ack
0
to
tr
ack
76,
with
the
read/wr
i
te
heads
unloaded.
Select
the
auto
seek
test
as
follows.
a.
Turn
off
the
power
to
the
disk
drive.
b.
Connect
diagnostic
pin
T3
to
the
center
pin.
c.
Turn
on
the
power
to
the
disk
drive
to
start
the
auto
seek
test.
5.1.3
Auto
Seek
and
Auto
Tap
Test
The
auto
seek
and
auto
tap
test
performs
the
auto
seek
and
auto
tap
functions
simultaneously.
Select
the
auto
seek
and
auto
tap
test
as
follows.
a.
Turn
off
the
power
to
the
disk
drive.
b.
Connect
diagnostic
pins
T2
and
T3
to
the
center
pin.
c.
Select
head
load
jumper
position
HL2
and
connect
HL2
to
ground.
d.
Turn
on
the
power
to
the
disk
drive
to
start
the
auto
seek
and
auto
tap
test.
5.2
HEAD
UNLOAD
DELAY
To
delay
the
head
unload
action
by
250
ms,
short
pin
Tl
(see
Figure
5-1)
to
ground.
With
Tl
shorted
to
ground,
rapid
head
load/unload
actions
(less
than
250
ms
apart)
cannot
occur.
Normally
this
pin
is
open.
5-2

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