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PerkinElmer EnVision User Manual

PerkinElmer EnVision
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Specifications
72
Measurement modes
Fluorescence intensity from top
Fluorescence intensity from top and bottom
Time-resolved fluorescence from top
Time-resolved fluorescence from top and bottom
Multiple window TRF
Homogenous TRF (LANCE, HTRF, LanthaScreen)
Fluorescence polarization
Absorbance
Luminescence
Ultra Sensitive Luminescence
Dual emission
AlphaScreen or HTS AlphaScreen
Adjustable measurement height
Dispensing
Plate shaking
Three plate shaking modes are available: linear, orbital and double orbital.
Three speed levels can be selected and the amplitude of the movement is
adjustable.
Scanning
Scanning of wells (several measuring points within a well) are available for
all technologies.
Kinetics
Repeated measurements or operations can be defined by plate or well.
Monochromator option
Two double monochromators are located inside the instrument casing. Light
fibers are used to guide the light to and from them. The excitation light from
the lamp is directed through the excitation double monochromator into the
sample. The emission light from the sample is directed through the emission
double monochromator to the detector.
Applications supported
Photometric application range 230 – 1000 nm
Photometric spectrum scan 230 – 1000 nm
Fluorescence intensity application range 230 - 850 nm
Fluorescence intensity excitation & emission spectrum scan
measurement 230 - 850 nm

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PerkinElmer EnVision Specifications

General IconGeneral
Light SourceXenon flash lamp
SoftwareEnVision Manager
Read ModesAbsorbance, Fluorescence, Luminescence, Time-Resolved Fluorescence, Fluorescence Polarization
Plate Formats384-well
Detection TechnologyPMT
Temperature ControlAmbient to 45°C