Sony Ericsson K850 - Test

K850
1203-2528 rev. 1
MEASUREMENT POINTS Test
MEASUREMENT POINTS
Made for
Document Nr Revision
SP5101
SP5102
SP5103 SP5104 SP5105
SP5107
SP5106
SP5108
SP5109
SP5110
SP5111
SP5112
SP5113
SP5114
SP5115
SP5116
SP5117
SP5118
SP5119
SP5120
ASTA/ANJA
N3
N2
M2
M3
A21
A1
M1
P1
D2000
1200-0795
ASTA/ANJA_JTAG
TDI
TMS
TRSTn
TCK
TEMU0n
TEMU1n
TDO
RTCK
Asta/Anja_TEST
JTAG_EMULATION_IF
ASTA/ANJA
81G9L
V6
D2000
1200-0795
ASTA/ANJA_UNUSED
EFUSE_HV4
Asta/Anja_NOT_USED
UNUSED
ASTA/ANJA
D6
A5
C6
B6
A8
D8
C8
D7
B8
C7
B7
A6
D5
D2000
1200-0795
ASTA/ANJA_ETM
ETM_TCLK
ETM_TSYNC
ETM_TPKT0
ETM_TPKT1
ETM_TPKT2
ETM_TPKT3
ETM_TPKT4
ETM_TPKT5
ETM_TPKT6
ETM_TPKT7
ETM_PSTAT0
ETM_PSTAT1
ETM_PSTAT2
Asta/Anja_TEST
EMBEDED_TRACE_IF
ASTA/ANJA
D2000
R21
1200-0795
ACCESS_GPIO23
ACCESS_GPIO23
ASTA/ANJA
D2000
N19
1200-0795
APPLICATION_GPIO09
APPLICATION_GPIO09
ASTA/ANJA
D2000
M21
1200-0795
APPLICATION_GPIO06
APPLICATION_GPIO06
ASTA/ANJA
D2000
N20
1200-0795
APPLICATION_GPIO08
APPLICATION_GPIO08
ASTA/ANJA
D2000
T4
1200-0795
ACCESS_GPIO13
ACCESS_GPIO13
ASTA/ANJA
D2000
R2
1200-0795
ACCESS_GPIO10
ACCESS_GPIO10
10Kohms
R5100
100Kohms
R5101
TEMU1n low enables JTAG.
Unused GPIO
Test
Test
1200-1891 Page 1 3
SEMC Troubleshooting Manual
55 (101)