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Tektronix 3 Series User Manual

Tektronix 3 Series
282 pages
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3 Series Mixed Domain Oscilloscope
Printable Help
(MDO32, MDO34)
W
arning: The servicing instructions are for use by qualified personnel only. To avoid personal injury, do not perform any servicing unless you are qualified
to do so. Refer to all safety summaries prior to performing service.
Supports Product Firmware V1.10.0 and later
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Click the following link to protect your product.
www.tek.com/register
*P 077149702*
077-1497-02

Table of Contents

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Tektronix 3 Series Specifications

General IconGeneral
Vertical Sensitivity1 mV/div to 10 V/div
Sample Rate2.5 GS/s
Channels2 or 4
Memory Depth10 Mpoints
Trigger TypesEdge, Pulse Width, Runt, Logic, Setup/Hold, Rise/Fall, Video
ConnectivityUSB, LAN
Vertical Resolution8 bits

Summary

Welcome to the 3 Series MDO instrument help

MDO34, MDO32 Key features and benefits

Lists the key features and benefits of the 3 Series MDO oscilloscopes, highlighting its integrated capabilities.

Accessories

Probes

Details various probes offered by Tektronix for different application needs, with part numbers.

Factory options

Arbitrary Function Generator (AFG) option

Details the AFG option, adding a 50 MHz AFG function with various waveform types and features.

Serial bus decode and trigger options

Covers options for serial bus decode and triggering for industry-standard serial buses.

Power Analysis option

Explains the power analysis option for measurements like power quality, switching loss, and harmonics.

Option upgrades

Post-purchase instrument options

Details how to add functionality to the 3 Series MDO after initial purchase using software license keys.

Bandwidth upgrade options

Explains how instrument bandwidth and spectrum analyzer frequency range can be upgraded post-purchase.

Getting acquainted with your instrument

Front panel controls and connectors

Describes the front panel controls and connectors providing access to key instrument settings and inputs.

Configuration menus

Details how to use configuration menus to set parameters for channels, system settings, and measurements.

Configure the instrument

Functional check

Procedure to verify the oscilloscope can display a waveform and take a measurement.

Download and install the latest firmware

Instructions for updating the instrument's firmware to ensure optimal performance and features.

Run Signal Path Compensation (SPC)

Guidance on running SPC at regular intervals for best measurement accuracy.

Compensate TPP0250, TPP0500B, or TPP1000 probes

Procedure to adjust probe compensation for best waveform capture and measurement accuracy.

Connect to a network (LAN)

Steps to connect the instrument to a network for remote access and data transfer.

Deskew analog input channels - quick visual method

Procedure to visually align waveform edges to compensate for timing differences between probes.

Deskew analog input channels - measurement method

Procedure to more accurately minimize timing differences between probes using a Delay measurement.

Analog channel operating basics

Acquiring a signal

Procedure to set scale and position parameters for analog signal acquisition.

How to trigger on a signal

Procedure to open the Trigger menu to select and configure trigger event type and conditions.

Set the acquisition mode

Procedure to set the method the instrument uses to acquire and display the signal.

Add a measurement

Procedure to select and add measurements to the Results bar.

Acquiring digital signals

Connect and set up digital signals

Use the digital Channel configuration menu to set up digital channels for acquiring signals.

Advanced triggering

Trigger on a pulse width event

Sets pulse-width triggering to mark when a signal pulse width meets specific criteria.

Setting waveform display parameters

Zooming on waveforms

Customizing measurements

Saving and recalling information

Menus and dialog boxes

Measurement configuration menu

Menu to add statistics and change measurement settings like source, levels, and gating.

Search configuration menu overview

Defines conditions to mark events on a channel or waveform signal.

Trigger configuration menu overview

Defines channel or waveform signal conditions for triggering the oscilloscope.

Waveform View configuration menu

Configures the Waveform View for style, persistence, intensity, markers, and other parameters.

Waveform acquisition concepts

Explains the acquisition system, hardware, sampling process, and waveform records.

Use the Arbitrary Function Generator

Describes the optional integrated arbitrary function generator (AFG) for signal simulation.

Triggering concepts

Provides an overview of user-defined trigger conditions for capturing waveforms.

Waveform display concepts

Explains the flexible and customizable display for controlling how waveforms appear.

Measurement concepts

Covers automatic and manual measurements in time and frequency domains, and DVM measurements.

Taking automatic measurements in the time domain

Explains how to take automatic measurements in the time domain.

Taking automatic measurements in the frequency domain

Explains how to take automatic measurements in the frequency domain.

Taking manual measurements with cursors

Guides on using on-screen cursors to take manual measurements on acquired data.

Making automated power measurements

Procedure to take automatic power measurements using the 3-PWR option.

Using FFT

Explains how to use FFT to display a graph of the frequency domain of a signal.

References

Upgrading firmware

Procedure to upgrade the instrument firmware using a USB flash drive or hard drive.

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