Bender EDS3090 - Changing the Measuring Clamp; Changing Between Insulation Fault Location IAL and Residual Current Measurement Ion Operating Modes; Quickly Checking the Response Values for IAL and Ion; Checking Info Menu

Operation
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EDS309x_D00012_03_M_XXEN/11.2014
6.6.2 Changing the measuring clamp
Two methods can be used to change the measuring clamp.
 Changing with EDS195P switched off:
– Disconnect clamp no longer required
– Switch on EDS195P
– Wait for "No CT connected" message
– Set required clamp type
– Connect related clamp
– Wait for end of self-test.
 Changing with the EDS195P in operation:
– Disconnect clamp from the device
– Wait for "No CT connected" message
– Set required clamp type
– Connect related clamp
– Wait for end of self-test.
6.6.3 Improved legibility due to display lighting
Press the button at the bottom left to improve the legibility of text and symbols.
Switch off the lighting by pressing the button again.
6.6.4 Changing between insulation fault location I
ΔL
and
residual current measurement I
Δn
operating modes
Here you can select the measuring function. I
Δn
for residual current measurement preferably in
TN/TT systems. I
ΔL
for insulation fault location in IT systems.
Avoid changing the mode during insulation fault location.
6.6.5 Quickly checking the response values for I
ΔL
and I
Δn
Press the INFO button three times to display the actual response values.
6.6.6 Checking Info menu
The following information appears on the display in succession on pressing the INFO button:
 Device name, time, date and manufacturer
 Software version with date
 Actual response values I
ΔL
and I
Δn
 Status information, coded, see page 58