HP 5528A User Manual

Model 5528A
Appendix A: Pri nciples of Ope ralion
COMPENSATED WOLLASTON PRISM
(STRAIGHTNESS IN\TERFEROMETER ASS EMBLY)
I,
I, ------"'"
MIRRORS
(S
TRAIGHTNES S
REFLECTOR)
1\ " 0.' /
" ____ "- M.IRROR AXIS
n2.\!n 2. ,
NOTE: WEDGE n '.2 HAS A REFRACTIVE INDEX
OF
n, FOR ONE PLANE OF POLARIZATION
AND n2 FOA THE OTHER PLANE.
WEDGES n2,1 HAVE THE OPPOSITE
PROPERTY.
Figure A· 5, S tr aightness Measurements
Squareness Measurements
.1
A Sq uarene ss measurement co nsists of two perpendi cu la r Straight ne ss measu rement s made
from the sa me Straightness Reflector. P erpendi cularity is achieved using an Optical Square,
Squarene ss is calcul ale d by adding or subtracting the slopes for each Straightness measur ement
to a right angle (provid ed by the Op tical Square ). Secti on 21 of this User's Guide shows ho w this is
done .
Parallelism Measurements
A Parallelism measurement is similar to a Squareness measurem en t. excep t it does not use an
Optical S qu are.
A
Parallelism meas ur eme nt co nsists of two Straightness measurements, m ade along the same axis
from the
same Straigh tness Re fl ector. (See Secti on 14 in this User's Guide .)
Parallelism is calculated by comparing t he slopes of the two Straightness meilsurements, as
described in Section 14 of this Use r 's Guide.
A-9

HP 5528A Specifications

General

Brand	HP
Model	5528A
Category	Measuring Instruments
Language	English