94 tina96e1-b (2016-12) VGC501_VGC502_VGC503.om
RST corresponds to the TRS command
Transmit: TAD <CR>[<LF>]
Receive: <ACK><CR><LF>
Transmit: <ENQ>
Receive: aa.aaaa,bb.bbbb,cc.cccc <CR><LF>
Description
aa.aaaa A/D converter channel 1
Measurement signal [0.0000 … 11.0000 V]
bb.bbbb A/D converter channel 2
Measurement signal [0.0000 … 11.0000 V]
cc.cccc A/D converter channel 3
Measurement signal [0.0000 … 11.0000 V]
Transmit: TAI <CR>[<LF>]
Receive: <ACK><CR><LF>
Transmit: <ENQ>
starts the test (very brief)
Receive: a.aa,b.bb,c.cc <CR><LF>
Description
a.aa Identification gauge 1 [kOhm]
b.bb Identification gauge 2 [kOhm]
c.cc Identification gauge 3 [kOhm]
Transmit: TDI [,a] <CR>[<LF>]
Description
a Display test, a =
0 –> Stops the test - display according to current operating
mode (default)
1 –> Starts the test - all segments on
Receive: <ACK><CR><LF>
Transmit: <ENQ>
Receive: x <CR><LF>
Description
x Display test status
Test of the parameter memory.
Transmit: TEE <CR>[<LF>]
Receive: <ACK><CR><LF>
Transmit: <ENQ> Starts the test (duration <1 s)
Do not keep repeating the test (EEPROM life).
Receive: aaaa <CR><LF>
Description
aaaa Error word
RST - Operating hours
TAD - A/D converter test
TAI – ID resistance test
TDI - Display test
TEE - EEPROM test