Keithley 2001 - Display

Troubleshooting
2-30
Test 200.3 – FAST circuit
Pass/Fail
Defective FAST circuit
This test uses the same circuit setup as Test 200.1. Line cycle integration and FAST is
selected on U808. The FAST circuit includes U806 (FS1), Q813, R842, and the FS1 con-
trol line from U808.
U606, Q813, R842 and U808
DC_STB
Registers
R1_STB
Registers
R2_STB
Registers
U801 Q1: 1
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 0
Q7: 0
Q8: 0
U307 Q1: 1
Q2: 1
Q3: 0
Q4: 1
Q5: 1
Q6: 1
Q7: 1
Q8: 1
U505 Q1: 0
Q2: 0
Q3: 1
Q4: 0
Q5: 0
Q6: 0
Q7: 0
Q8: 0
U800 Q1: 1
Q2: 1
Q3: 0
Q4: 0
Q5: 0
Q6: 0
Q7: 1
Q8: 1
U305 Q1: 1
Q2: 0
Q3: 1
Q4: 0
Q5: 0
Q6: 0
Q7: 1
Q8: 1
U500 Q1: 1
Q2: 1
Q3: 0
Q4: 1
Q5: 1
Q6: 1
Q7: 1
Q8: 1
U300 Q1: 1
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 1
Q7: 0
Q8: 0
U302 Q1: 1
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 1
Q7: 1
Q8: 0
U530 Q1: 0
Q2: 0
Q3: 0
Q4: 0
Q5: 0
Q6: 0
Q7: 0
Q8: 1
U303 Q1: 0
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 1
Q7: X
Q8: X
U501 Q1: 1
Q2: 1
Q3: 0
Q4: 1
Q5: 1
Q6: 1
Q7: X
Q8: X
Note: Tables 2-10 through 2-12 provide functional descriptions of the register bits.
Type
Failure analysis
Description
High suspect
components
Bit pattern