Keithley 2001 - Page 42

Troubleshooting
2-29
Test 200.2 – A/D noise
Pass/Fail
Noisy signal conditioning.
This test uses the same circuit setup as test 200.1. The A/D is triggered for 10 readings
and a mininmum/maximum comparison is done for 30 counts or less. Failing this test
indicates A/D buffer noise or A/D converter circuit noise.
DC_STB
Registers
R1_STB
Registers
R2_STB
Registers
U801 Q1: 0
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 0
Q7: 0
Q8: 0
U307 Q1: 1
Q2: 1
Q3: 0
Q4: 1
Q5: 1
Q6: 1
Q7: 1
Q8: 1
U505 Q1: 0
Q2: 0
Q3: 1
Q4: 0
Q5: 0
Q6: 0
Q7: 0
Q8: 0
U800 Q1: 1
Q2: 1
Q3: 0
Q4: 0
Q5: 0
Q6: 0
Q7: 1
Q8: 1
U305 Q1: 1
Q2: 0
Q3: 1
Q4: 0
Q5: 0
Q6: 0
Q7: 1
Q8: 1
U500 Q1: 1
Q2: 1
Q3: 0
Q4: 1
Q5: 1
Q6: 1
Q7: 1
Q8: 1
U300 Q1: 1
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 1
Q7: 0
Q8: 0
U302 Q1: 1
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 1
Q7: 1
Q8: 0
U530 Q1: 0
Q2: 0
Q3: 0
Q4: 0
Q5: 0
Q6: 0
Q7: 0
Q8: 1
U303 Q1: 0
Q2: 1
Q3: 1
Q4: 1
Q5: 1
Q6: 1
Q7: X
Q8: X
U501 Q1: 1
Q2: 1
Q3: 0
Q4: 1
Q5: 1
Q6: 1
Q7: X
Q8: X
Note: Tables 2-10 through 2-12 provide functional descriptions of the register bits.
Type
Failure analysis
Description
Bit pattern