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National Instruments DAQ Series - Page 64

National Instruments DAQ Series
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Glossary
DAQCard-700 User Manual G-6 ni.com
sample interval amount of time between samples
sc clock period
scan interval the number of channels multiplied by the sample interval
settling time the amount of time required for a voltage to reach its final value within
specified limits
T
TIO timing input/output
trigger any event that causes or starts some form of data capture
TTL transistor-transistor logic
twos complement given a number x expressedinbase2withn digits to the left of the radix
point, the (base 2) number 2n - x
U
unipolar a signal range that is always positive (for example, 0 to +10 V)
V
V volts
V
cm
common-mode noise
VDC volts, direct current
V
diff
differential input signal
VI virtual instrument
V
IH
volts, input high
V
IL
volts, input low
V
in
volts in
V
OH
volts, output high
V
OL
volts, output low
V
s
signal source

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