156
EPOCH 4PLUS
9.17.5 Crack Sizing with API 5UE
Once the EPOCH 4PLUS has been calibrated to a reference notch using one of the
processes described above, you can begin sizing potential defects using the API 5UE
software. Crack sizes appear in the upper right corner of the live A-Scan display after each
sizing process. Related data can be saved for each inspection using the EPOCH 4PLUS
datalogger. Two methods of crack sizing are available with the API 5UE software:
Envelope Mode and Manual Mode.
9.17.5.1 Envelope Mode
A simple method of inspection of crack depth with the EPOCH 4PLUS is using API 5UE
in Envelope Mode. This method allows the operator to collect pertinent data with the press
of a single key and size potential defects in the most efficient manner. The data collection
process in Envelope Mode is similar to the process described above for Envelope Mode
calibration.
Once the API 5UE software has been properly calibrated to a reference notch, use the
following steps to size a crack using Envelope Mode:
1. Find the signal from the potential defect and bring it to maximum amplitude (see
API’s Recommended Practice 5UE for crack scanning and inspection requirements).
2. If necessary, use the AUTO80% feature to bring the peak amplitude to 80% of FSH.
To use this feature, press the [GATE 1] key and press the AUTO80% key [F5].
3. Press [PEAK MEM] to activate the PEAK MEMORY function.
4. Scan forward and backward from the peak amplitude of the crack to draw a peak
envelope for the crack signal.
5. Adjust your screen range to adequately encompass the entire peak envelope and set
GATE LEVEL to less than half the peak amplitude height (in % FSH).
6. Press the COLLECT key [F2] to collect A
max
, T
1,
and T
2
from the peak envelope. The
crack size indication (d
i
) appears at the top right corner of the live A-Scan display.
Figure 111 Collection
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