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ST STM32F2 Series - Page 6

ST STM32F2 Series
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Figure 1. STMicroelectronics product development process
· Key characteristics and
requirements related to future
uses of the device
· Industry domain(s), specific
customer requirements and
definition of controls and tests
needed for compliance
· Product target specification
and strategy
· Project manager
appointment to drive product
development
· Evaluation of the
technologies, design tools
and IPs to be used
· Design objective
specification and product
validation strategy
· Design for quality techniques
(DFD, DFT, DFR, DFM, …)
definition
· Architecture and positioning
to make sure the software
and hardware system
solutions meet the target
specification
· Product approval strategy
and project plan
· Semiconductor design
development
· Hardware and application
development
· Software development
· Analysis of new product
specification to forecast
reliability performance
· Reliability plan, reliability
design rules, prediction of
failure rates for operating life
test using Arrhenius’s law and
other applicable models
· Use of tools and
methodologies such as
APQP, DFM, DFT, DFMEA,
FMKM
· Detection of potential
reliability issues and solution
to overcome them
· Assessment of Engineering
Samples (ES) to identify the
main potential failure
mechanisms
· Statistical analysis of
electrical parameter drifts for
early warning in case of fast
parametric degradation (such
as retention tests)
· Failure analysis on failed
parts to clarify failure modes
and mechanisms and identify
the root causes
· Physical destructive analysis
on good parts after reliability
tests when required
· Electrostatic discharge (ESD)
and latch-up sensitivity
measurement
· Successful completion of
the product qualification
plan
· Secure product deliveries
on advanced technologies
using stress methodologies
to detect potential weak
parts
· Successful completion of
electrical characterization
· Global evaluation of new
product performance to
guarantee reliability of
customer manufacturing
process and final application
of use (mission profile)
· Final disposition for product
test, control and monitoring
1 Conception
3 Qualification
2 Design &
validation
UM1845
STMicroelectronics standard development process
UM1845 - Rev 4
page 6/108

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