4.2.4 Internal temperature
The abnormal increase of the internal temperature is a potential source of dependent failures, because it can
affect many MCU parts and therefore lead to not-independent failures. The safety mechanism to be used to
mitigate this potential effect is the following:
• VSUP_SM_3: the internal temperature read and check allow the user to quickly detect potential risky
conditions before they lead to a series of internal failures. Refer to Section 3.6.18 Power control for the
detailed safety mechanism descriptions.
UM1845
Dependent failures analysis
UM1845 - Rev 4
page 85/108
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