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Agilent Technologies 5975 MSD

Agilent Technologies 5975 MSD
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Scientific Instruments Manufacturer GmbH
D-46149 Oberhausen +49-208-94 10 78-0 www.sim-gmbh.de
5.5 DIP (PCI) Performance test for DIP/5975 MSD Systems
This test uses a traceable standard solution to determine the correct performance of the DIP.
Perform this procedure on both types of probe tips (for liquid and for solid samples).
REQUIREMENTS
- An autotune has been performed.
- A new method for DIP CI measurements has been created in the MS ChemStation
software:
Follow the instructions of the MSD ChemStation manual and note that there are some
different inputs to be made:
• In the menu item “Inlet/Injection Types” select for “Sample Inlet” Other/None, and for
“Injection Source” External Device and enter the value for “Total Runtime” (take the
value displayed in the DIP software minus 1.5 )(see DIP manual)
CONDITIONS
DIP Ready/Bereit
DIP method check_CI.dip (30°C for 0.1 min, 30-350°C at 1.0°/s, 350°C for 5 min)
MSD Ready
MSD method DIP_CI_Q1.M
MSD aux temp 280°C
Tune file PCICH4.U
Aquisition mode SCAN
Run length 10.00 min
column flow 0.5 ml/min
Solvent delay 0.02 min
EMV PCICH4.U + 400 V
Mass range (low) 50.0
Mass range (high) 550.0
Threshold: Inst 150
Sampling 2
MS quad temp 150°C
MS ion source temp. 250°C
Sample DBP
Push rod tip A: liquid samples, B: solid samples
Sample volume 1 µl

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