Integrating Sphere
Fig. 19-2 Optical path in transmittance measurements
1 Mirror 2 7 Reflector
2 Mirror 3 8 Detector of SPECORD
®
3 Cell with scattering sample 9 Baffle plate 2
4 Baffle plate 1 10 Spectralon
®
insert for reflectance aperture
5 Spectralon
®
insert in place of gloss trap 11 Mirror 1
6 Non-scattered radiation 12 Beam path of SPECORD
®
Baffle plate 1 (Fig. 19-2 / 4) prevents the direct light of the sample from being incident on
the detector surface. Baffle plate 2 (Fig. 19-2 / 9) prevents the light not scattered by the
sample from being incident on the detector of the SPECORD® after the first reflection by
the SPECORD® insert (Fig. 19-2 / 10).
If you want to measure samples in cells, you can vary the height of beam transmission
through the cell by adjusting the stop (Fig. 19-1 / 4). In this way, you can set the following
beam heights: 8.5 and 15 mm.
For the transmittance measurement of larger solid samples, you may remove the stop
(Fig. 19-1 / 4) and the knurled screw on the Spectralon
®
insert (Fig. 19-1 / 18). You can
place the sample onto the thus arising smooth surface.
Preparing the measurement
1. First, insert reflector (Fig. 19-1 / 20) as far as it will go into the round aperture in the
middle of the rear mount for the cell holder. The flange of the reflector should rest on
the mount.
2. Insert the Spectralon
®
insert (Fig. 19-1 / 18) in aperture (Fig. 19-1 / 11). Screw in
locating pin (Fig. 19-1 / 12) to ensure correct position of the insert.
3. Adjust stop (Fig. 19-1 / 4) to the desired beam transmission height.
128 User’s Manual SPECORD 200/205/210/250 – Accessories 07/2005
Analytik Jena AG
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