Tau User’s Manual 3—Basic Operation of the Tau and GUI
TAU-0035-00-10, version 100 April 2009 3-13
Test-Pattern: A Test-Pattern mode is provided to verify
camera electronics.
Off: No test-pattern is provided in this mode.
This is the normal mode for viewing thermal
imagery.
Ramp: In this ramp mode, the test pattern shown
below and in the Color/LUT section that follows is
provided at the analog and digital data channels.
The above ramp pattern repeats 19 times in the complete 320 x 256 image.
Note
The ramp test pattern is intended primarily for verifying the output of the digital data channel.
The pattern will not necessarily look as shown above when displayed on an analog video
monitor, particularly if an Automatic Gain Control (AGC) mode other than Automatic is
selected. The above image is a horizontal slice of the full displayed image.
Figure 3-5: Ramp test pattern example for Top Portion of Tau Ramp Image
(Digital values shown apply to the optional 14-bit digital data stream.)
pix(0,0) = 0 pix(639,0)
pix(25,409) = 0
pix(25,408) = 16383
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