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Error Messages
SCPI Error Messages
406
407
408
409
410
411
412
413
-330, “Self-test failed;Self Test Patch
Table
Locked(406)”
Indicates that segment 7 of the CPU board DIP switch is closed,
prohibiting modiEcation of the test patch table. Switch 7 must be
in the open position to allow modification.
-330, “Self-test failed;Instrument Bus Error
Occurred(407)”
As part of the power on process, the cpu attempts to write and
read a special latch on the
A5
timer board to verify the integrity of
the instruments data and address bus. This test has failed. Refer to
service documentation for troubleshooting information.
-330, “Self-test failed;Static Ram Overflow by
Firmware(408)”
Indicates that after the instrument is up and running, a series of
power on self-tests have been run and Static Ram was found to be
overflowed by the program running in firmware.
-330, “Self-test failed;Static Ram Not Recovered
Error(409)”
Indicates that after the instrument is up and running, a series
of power on self-tests have been run and error correction code
checking has found that contents of Static Ram (SRAM) has been
corrupted during power up. SRAM Calibration data and SRAM
Instrument State have been cleared and are lost. The rear panel
dip switch 7 can/may be set to deliberately cause this condition.
-330, “Self-test failed;Power Supply Voltage
Error(410)”
Indicates that after the instrument is up and running, a series of
power on self-tests have been run and Power Supply Voltage errors
were found.
-330, “Self-test failed;CPU Self Test Error On Power
Up(411)”
Indicates that after the instrument is up and running, a series of
power on self-tests have been run and the CPU board tests failed.
-330,“Self-test
failed;ROM
Checksum Error (LOW
BYTE)(412)”
Indicates that after the instrument is up and running, a series
of power on self-tests have been run and error correction code
checking has found that the FLASH ROM has a low byte error.
-330, “Self-test failed;ROM Checksum Error (HIGH
BYTE)(413)”
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