IEEE-488 Reference
3-150
Query :STARt? Query stop voltage
Description This configuration command is used for the following tests:
Diode Leakage Test
Staircase Sweep Test
This command is used to specify the start voltage for the specified test.
3.25.3 :STOP <NRf> :TSEQuence:DLEakage:STOP <NRf> Stop voltage; diode leakage test
:TSEQuence:STSWeep:STOP <NRf> Stop voltage; staircase sweep test
Parameters <NRf> = -100.0 to 100.0 Volts; 100V range
-1000 to 1000 Volts; 1000V range
Query :STOP? Query stop voltage
Description This configuration command is used for the following tests:
Diode Leakage Test
Staircase Sweep Test
This command is used to specify the stop voltage for the specified test.
3.25.4 :STEP <NRf> :TSEQuence:DLEakage:STEP <NRf> Step voltage; diode leakage test
:TSEQuence:STSWeep:STEP <NRf> Step voltage; staircase sweep test
Parameters <NRf> = -100.0 to 100.0 Volts; 100V range
-1000 to 1000 Volts; 1000V range
Query :STEP? Query step voltage
Description This configuration command is used for the following tests:
Diode Leakage Test
Staircase Sweep Test
This command is used to specify the step voltage for the specified test.
3.25.5 :MDELay <NRf> TSEQuence:DLEakage:MDELay <NRf> Measure delay; diode leakage test
:TSEQuence:RVCoefficient:MDELay[1] <NRf> Measure delay 1; resistor voltage coefficient test
:TSEQuence:RVCoefficient:MDELay2 <NRf> Measure delay 2; resistor voltage coefficient test
Parameters <NRf> = 0 to 99999.9 (Resistor voltage coefficient test) Delay in seconds
0 to 10000 (Diode leakage test) Delay in seconds
Query :MDELay? Query measure delay
Description This configuration command is used for the following tests: Diode Leakage Test Resistor Volt-
age Coefficient Test
This command is used to specify the measure time for the specified test. Note that the Resistor
Voltage Coefficient Test uses two measure delays; delay 1 and delay 2.