76 Keysight CXG, EXG, and MXG X-Series Signal Generators Service Guide
Self Test
Self Test Descriptions
303 Offset VCO Detector (MXG)
This test checks that the offset VCO outputs a signal at various tuning voltages
and that the power can be detected downstream with a power detector. The
VCO should be able to oscillate from a tuning voltage of around -0.3V to over
+16V. The test is performed with the offset loop set to open-loop mode so that
the tuning voltage applied is predictable and based solely on the offset pretune
DAC.
304 Offset Attenuator (MXG)
This test checks that the adjustable offset attenuator is working properly. The
offset VCO is first set to open loop mode with a pretune DAC value set to 1/4 of
max value. The attenuator is set to minimum attenuation (0 dB) and maximum
attenuation (31.75 dB) while a power detector is used to sense the change in
power.
305 Offset PLL Unlock Detector (MXG)
This test checks that the offset PLL unlock detector is properly working.
306 Offset Reference Select (MXG)
This test checks the reference select frequency to the offset loop is functioning
properly.
307 Offset Tuning Voltage (MXG)
This test checks the offset loop tuning voltage at specific offset loop
frequencies.
308 FracN Tuning Voltage (MXG)
This test checks the FracN loop tuning voltage at specific FracN loop
frequencies.
309 FracN Detector (MXG)
This test checks that the FracN VCO is outputting power across the frequency
range and can be measured downstream using the power detector. This test
also checks that the VCO Collector DAC is functioning by measuring the effects
on the FracN power.
310 FracN Unlock Detector (MXG)
This test checks that the FracN unlock detector is properly working.
311 Sum Pretune DAC
This test checks to make sure the sum pretune DAC circuitry is working.
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