14
Accuracy Value
better than 1% for R > 0.125 and R < 16 M
L > 2.5 H and L < 25 kH
C > 1.25 pF and C < 12.8 mF
better than 5 % for R > 21 m and R < 96 M
L > 420 nH and L < l50 kH
C > 0.21 pF and C < 77 mF
at the following conditions:
1.0V, 0.5V, or 0.25V output voltage
Slow or medium measurement speed
Q and D < 0.1 for R and C
Q > 10 for L
100Hz, 120Hz or 1 KHz test frequency for R
100 Hz test frequency for L
max
and C
max
10 KHz test frequency for L
min
and C
min
Features and Options
General Features
4-wire Kelvin fixture for parts with radial and axial leads
Protected up to 1 Joule of stored energy, 200 V DC for charged capacitors;
fused at 0.25 A output current for biased measurement
Open and short circuit compensation. Compensation Limits: short circuit:
R<20, Z<50, open circuit: Z>10k
Up to 8 Pass Bins, QDR and General Fail Bins, all defined by the front panel or
computer interface. Binning setups may be stored in nonvolatile memory
Tests the ROM, CPU, nonvolatile RAM, clock generator, A/D converter,
internal bias, multiplier, output drive circuitry, gain circuitry, and source
resistances.
Stores and recalls nine complete instrument setups. Recall 0 recalls the default
setup.
All instrument functions can be controlled or read over the interface.
0 to 50°C at a relative humidity of 0 to 80%
20 Watts, 110/220 VA, 50/60 Hz
4 ¼ " H 14 ¼ " W 15" D
Two year parts and labor on materials and workmanship