Texas Instruments AFE5832 - AFE5832: ADC: Test Pattern

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SLOU489–August 2017
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Overview of the AFE5832 EVM GUI Features
B.3.2 Test Pattern Subtab
The Test Pattern subtab for the AFE5832 has the following feature:
• Selecting preset or custom test patterns to be generated by ADC for LVDS or on certain clock lines
Figure 52. AFE5832: ADC: Test Pattern