Thytronic NC020 - Event Recording - Events; Info; Protections Trip; Self-Test

MEASURES, LOGIC STATES AND COUNTERS
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NC020 - Manual - 05 - 2022
— Event recording - Events
Recording is triggered by:
• Power up and/or Power down.
• Element start or trip.
• Binary input switch (OFF-ON or ON-OFF).
Fifty events are recorded into a circular FIFO (First In, First Out) buffer (Read \ Events \ Info menu).
[1]
Following information are stored in every record (Read \ Faults \ Event menu):
• Event counter (Events stored)
[2]
E-Number
• Event cause E-Cause
• Date and time E-Year
• Date and time E-Month
• Date and time E-Day
• Date and time E-Hour
• Date and time E-Minute
• Date and time E-Second
• Date and time E-Millisecond
— Info
• Code NC020-a
• Serial ...... (Serial number)
• Firmware release ...... (eg: 1.00)
• Nominal freq. (eg: 50 or 60 Hz)
— Protections trip
• Protections trip (eg: Trip I>>)
— Self-test
Following information are available (Read \ Self test \ Info menu):
• Type
• Self-test cause
• Self-test latch
The relay self-test function classifies relay operational anomalies according to three levels:
- MINOR ANOMALY: The device continues to function within the possible limits with the protective
devices activated;
- MAJOR ANOMALY: Operation of the device may be corrected by the operator by resetting the
initial (default) configuration and hence the desired settings;
- FATAL ANOMALY: All logic and protective functions are inoperative and the relay must be returned
to the factory.
The internal self-test function is capable of detecting the following anomalies and indicating them
by means of messages:
- defective auxiliary power supply (FATAL ANOMALY);
- output relay coil breakage (FATAL ANOMALY);
- alteration of the calibration data stored in EEPROM memory (FATAL ANOMALY);
- alteration of the parameters (threshold setting, times, relays… etc.) in EEPROM memory (MAJOR
ANOMALY);
- alteration of the data (counters, records, ...etc.) in EEPROM memory (FATAL ANOMALY);
Upon detection of at least one of the above mentioned anomalies, the output relay programmed for
Self-test is switched and the information is recorded (latched).
Note 1 The newest event data are stored inside the event addressed by the Last event parameter (1...50)
Note 2 Counter is updated at any new record; it may be cleared by means ThyVisor