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Uson sprint iq - 4.1.6 Creep Test; 4.1.7 Crack Test

Uson sprint iq
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76
Programming
4.1.6 Creep Test
A subset of burst testing is creep testing. Use Sprint iQ’s burst
parameters menu (test type Burst) to setup a creep test. A creep
test is often used to test products such as blister packages that
need to hold a certain amount of air pressure without failing,
although the package may increase in size or creep up during the
test. A creep test is programmed by using a burst program, so
there is no creep parameters menu.
The only difference between a standard burst test and a creep test
is that in a creep test the minimum and maximum setpoints are set
to the same value.
Setting the minimum and maximum setpoints to the same
pressure causes Sprint iQ to pass product reaching the min/max
pressure setting. Products not reaching the min/max setpoint in
the allowed test time are rejected. Products opening to
atmosphere (bursting) before reaching the min/max setpoint are
also rejected.
Use the same procedure for programming a Burst Test to enter
values for a creep test. Everything is set the same way as a burst
test except that the min and max setpoints are set to the same
pressure value.
4.1.7 Crack Test
Crack testing is a test in which the Sprint iQ is used to detect a
slight opening or change in pressure. Crack testing is used in
devices such as valves intended to open a certain pressure range.
Because a crack is desired, a pass indication is given if the crack
happens within established tolerances.
Crack testing is related to burst testing. A burst test is used with
products that open quickly to atmosphere and create a dip in
pressure called an event. In some products the event is too small

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