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Zeiss BSD4 - Abbreviations; Directives and Standards

Zeiss BSD4
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8. Abbreviations
9. Directives and standards
This is to declare that the component mentioned above fulfils all the relevant provisions of
Directive 2006/42/EC: Machinery Directive
Directive 2004/108/EC: Electromagnetic Compatibility
Applied harmonized standards:
Standard EN 60204-1:2010: Safety of machinery - Electrical equipment of machines - Part 1:
General requirements
Standard EN 61000-6-4:2007: EMC - Conductive and Radiated Emissions (Class A on Radi-
ated Emissions)
Standard EN 61000-6-2:2005: EMC - Immunity
Standard EN 61010-1:2010: Safety Requirements for Electrical Equipment for Measurement,
Control, and Laboratory Use
Standard EN ISO 12100:2010: Safety of machinery – General principles for design – Risk as-
sessment and risk reduction
BSD4 detector Five segment backscattered electron detector
BSD Backscattered electron detector
BSE Backscattered electron
COMPO Detects compositional contrast
Detection of contrast between areas with different chemical composi-
tions
EHT Extra High Tension
FESEM Field emission scanning electron microscope
GIS Gas injection system
ODF Orientated Dark Field
SE Secondary Electron
STEM Scanning transmission electron mircroscopy
TOPO Topographic contrast
Detects changes of the specimen surface angle
Denomination: BSD4 detector