1MDU07205-YN rev. F
REF601 CEI
User’s manual
61
5.2.9.3 Trip Output Test
This submenu selection provides testing of trip circuit connected to the product.
Pulse of defi nite duration will be generated at the trip command output port of the
product, which energizes the trip coil connected therein. This action is not of latch-
ing nature, and lasts only for the specifi ed duration (200msec low pulse in case of
Normally Open type trip circuit contacts.
5.2.9.4 Functional Test
This menu provides selection of one of the several protection parameter groups
available in the product. User is required to connect specifi c hardware and apply
typical current signals to specifi ed phase/earth inputs. Protection algorithm then
can be run with the selected protection parameter group and trip signaling timings
can be observed on either on LEDs or optionally on CRO.
F u n c t i o n a l T e s t
F u n c t i o n a l T e s t
S G 0 1 : Y Y Y
N o
Y e s
F u n c t i o n a l T e s t
S G 1 7 : Y Y Y
N o
Y e s
Fig.35- Functional test with its display view
Menu structure & LHMI Navigation
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