1. Check that the IED settings are appropriate, for example the pickup value and the
time delay.
2. Supply the IED with three-phase voltages at their rated values and frequency 20
mHz over the set value StartFrequency, applying it for a time that is at least 10%
longer than (tDelay+100 ms).
3. Verify that the TRIP signal is active.
4. Decrease the frequency with a 40 mHz step, applying it until the TRIP signal resets.
5. Measure the reset time of the TRIP signal, and compare it with the technical data of
the function.
Verification of the low voltage magnitude blocking
1. Check that the IED settings are appropriate, especially the PUFrequency and the
tDelay in SAPTOF, and the GlobalBaseSel and the MinValFreqMeas in the SMAI
preprocessing function.
2. Supply the IED with three-phase voltages at rated values.
3. Slowly decrease the magnitude of the applied voltage until the BLKDMAGN signal
appears.
4. Note the voltage magnitude value and compare it with the value MinValFreqMeas x
UBase / 100.
Where:
• MinValFreqMeas is a set value of the SMAI.
• UBase is the value in the GBASVAL group identified by the setting
GlobalBaseSel.
5. Slowly increase the frequency of the applied voltage, to a value above PUFrequency
as explained in Section Verification of START value and time delay to operate.
6. Check that the PICKUP signal does not appear.
7. Wait for a time corresponding to (tDelay+100 ms), and check that the TRIP signal
does not appear.
8. Slowly increase the magnitude of the applied voltages until the BLKDMAGN signal
resets.
9. Verify that the signal PICKUP appears and wait for a time at least equal to (tDelay
+100 ms) to verify that also the signal TRIP becomes active.
6.5.2.2 Completing the test
Continue to test another function or end the testing by setting the parameter TestMode to
Disabled under Main menu/Tests/IED test mode/TESTMODE:1. If another function is
tested, then set the parameter Blocked to No under Main menu/Tests/Function test
modes/Frequency/SAPTOF(81,f>)/SAPTOF:X for the function, or for each individual
function in a chain, to be tested next. Remember to set the parameter Blocked to Yes, for
each individual function that has been tested.
Section 6 1MRK 505 293-UUS A
Testing functionality
84
Commissioning manual