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Resistance tests. During a Run test or Leakage Current test, this terminal is
isolated from the test circuits.
6. GND: Connector used to attach the adapter box Ground or Earth lead to the
instrument.
7. PROBE HI: Connector used to attach the Probe-HI test lead to the DUT. When
used with an appropriate test lead, this terminal connects one side of the MD
(measuring device) to the DUT during Enclosure or Applied Part Leakage Current
tests. This terminal will be enabled during a Leakage Current test whenever Probe-
HI has been selected. When a Functional Run test or Leakage Current test is not
being performed, this terminal is isolated from the Functional Run test and
Leakage Current test circuits.
8. PROBE LO: Connector used to attach the Probe-LO test lead to the DUT. When
used with an appropriate test lead, this terminal connects one side of the MD
(measuring device) to the DUT during Applied Part Leakage Current tests. The
terminal is always used in conjunction with the Probe-HI terminal. When a
Functional Run test or Leakage Current test is not being performed, this terminal is
isolated from the Run test and Leakage Current test circuits.
9. MD CIRCUITS: Contains an external Measuring Device PCB that will enable
during a Leakage Current test when “External” is selected using the “Meas.
Device” soft key. The external MD allows the operator to configure a custom
measuring device using either a simple resistive component or a complex two pole
network.
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