60
Ramp Down: The length of time that is allowed for the test voltage to decay from
programmed test voltage to 0.
Arc Sense: During hipot testing some low current arcing may be allowable. Arc
sense is a maximum allowable threshold for arcing.
Arc Detect: If the Arc Fail mode is set to ON, the program will indicate an arc failure
when the arc current is exceeds this setting. Arc Detect may be selected ON or OFF
using a soft key.
Ramp-HI: The Ramp-HI function is active during the Ramp period only. Ramp-HI will
allow current higher than the normal Max-Lmt current setting of the DC Withstand
Voltage test to avoid false failure due to charging current.
Charge–LO: The Charge-LO function is used to check if the cables are connected
properly at the beginning of a test. This function is only available in DC Withstand and
Insulation resistance testing. A description of how to set up this parameter is given in
the 4.5.2. DC Withstand and 4.5.3. Insulation Resistance parameter sections of this
manual.
Offset: This function allows the instrument to compensate for lead and test fixture
resistance during a Ground Bond or Continuity test. A description of how to set up this
parameter is given in the 4.5.4.Continuity and 4.5.5. Ground Bond parameter
sections of this manual.
Frequency: This parameter is available in AC tests only and is selectable using a soft
key between 50 and 60Hz.
Continuity in ACW and DCW: This function checks for a connection between the
current and return lead. This is a basic DC continuity check and will not disclose a
Continuity value. Continuity may be selected ON or OFF using a soft key in the ACW
and DCW parameters.
Scanner Setup: (This parameter will only be seen on units equipped with a scanner).
This parameter allows for set up of the Scanner channels. The three different
selectable scanner states are: L (scanner channel set to the return point), H (scanner
set to the high voltage point) and O (OFF).
AC Source: This parameter is available in Leakage Current and RUN testing and is
used to enter the menu to control the AC Source’s test parameters. The AC Source’s
test parameters include: Voltage, Frequency, A-Hi (current high limit), Output N/G,
Voltage Range, and OC-Fold.
Active Link: When active, the Active Link feature keeps the DUT powered from one
Leakage Current test to another, from one Functional Run test to another, and in
between Leakage Current and Functional Run test steps.
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