9 | Appendix BYK-Gardner GmbH
68 wave-scan 3 / wave-scan 3 dual 301 200 085 E 2403
9.6 Technical Data
Measuring Data
Light source Laser diode (LED) and infrared super-luminescent diode (IR-SLED)
Laser diode Laser class 1, P ≤ 390 µW, λ=670 nm,
DIN EN 60825-1:2015-07
Measurement range For wave-scan 3:
High-gloss surfaces: Dullness < 40, linear range
For wave-scan 3 dual:
High to semi-gloss: Dullness < 65, linear range
Structure spectrum Dullness (du): < 0.1 mm
Wavelength a (Wa): 0.1 to 0.3 mm
Wavelength b (Wb): 0.3 to 1.0 mm
Wavelength c (Wc): 1.0 to 3.0 mm
Wavelength d (Wd): 3.0 to 10.0 mm
Wavelength e (We): 10.0 to 30.0 mm
Scan length 5 cm
10 cm
20 cm
Repeatability For wave-scan 3:
Dullness < 40: 4% or > 0.4 (standard deviation)
For wave-scan 3 dual:
Dullness > 40: 6% or > 0.6 (standard deviation)
Reproducibility For wave-scan 3:
Dullness < 40: 6% or > 0.6 (standard deviation)
For wave-scan 3 dual:
Dullness > 40: 8% or > 0.8 (standard deviation)
Object radius > 500 mm
Smallest sample size 35 mm x 150 mm
Resolution 375 pixel per cm
Battery capacity Up to 4,000 readings;
depending on duty cycle and display-on time
Memory capacity 10,000 readings
4,000 standards
1,000 test series
50 organizers
To Next Page
Loading...
