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Chroma 16502 - R SCAN Operation and Settings

Chroma 16502
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R SCAN Function
9-3
9.3 Operation for R SCAN
9.3.1 R SCAN Setting Step
1. Press MAIN INDEX after 16502 powered on, the screen is shown below.
<
M
A
I N
I N
D E
X >
C O
M
P A R E
B I N N I N G
T
E
M
P
. C
O N V .
R
S C
A
N
F4
R SCAN setting
F1
F2
F3
2. Next press R SCAN [F4]” under MAIN INDEX, the screen is shown below.
<
M
A I N I N D E X - R
S
C A N >
S E T T I N G
T E S T
F4
←>R>SCAN>measurement
F1
R SCAN test various conditions
setting
F2
F3
3. Press “SETTING [F1]to enter condition setting menu is given below.
< R S C A N S E T >
N O
M
I N A L 0 0 0 .
0 0
0 0 Ω D I G I T U P
H
I G
H
L O W
1
1 - 4 0 0 0
. 0 0
0 0 Ω 0 0 0
. 0 0
0 0 Ω D I G I T D O
W
N
2
2 - 4 0 0 0
. 0 0
0 0 Ω 0 0 0
. 0 0
0 0 Ω
3 3 - 4 0 0 0
. 0 0
0 0 Ω 0 0 0
. 0 0
0 0 Ω D I G I T
Δ R 0 0 0
. 0 0
0 0 Ω
P r e s s
M
A I N I N D E X t o e x i t
F4
F1
The cursor positioned number digit
up.
F2
The cursor positioned number digit
down.
F3
The cursor move right.
Press [], [], [] and [] to select the item to be set after entering R SCAN SET menu.
Press F1 to increase digit, F2 to decrease digit, F3 to select adjusted digit and F4 to select
high/low limit mode.
There are three groups of DCR in 16502 R SCAN function for test and pin variation. The
setting method is as the table below. The Default is for setting three groups of DCRs. The
extra DCR set to 0-0 via F1, F2 and F3 when these three groups of setting not to be used.
DUT Pin Setting
R SCAN Measurement
Equivalent Resistance
Pin 1 to Pin 2
1-2
R1+R2
Pin 1 to Pin 3
1-3
R1+R3
Pin 1 to Pin 4
1-4
R4
Pin 2 to Pin 3
2-3
R2+R3
Pin 2 to Pin 4
2-4
R2
Pin 3 to Pin 4
3-4
R3
Pin 0 to Pin 0
0-0
Not tested
Input the DUT nominal value to NOMINAL column and set the high limit of judgment test value
in HIGH numeric column as well as the low limit of that in LOW numeric column aside the pin.
PASS will be shown on if the test result meets high/low limit of the setting and FAIL will be
shown conversely. Press F4 for the high/low limit to select ABS MODE or % MODE.

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