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Ramp-HI
The Ramp-HI function is active during the Ramp period only. Ramp-HI will allow current higher
than the normal Max-Lmt current setting of the DC Withstand Voltage test to avoid false failure
due to charging current.
Charge–LO
The Charge-LO function is used to check if the cables are connected properly at the beginning of a
test. A capacitive DUT will draw charging current on the DC Withstand test when the Output is
activated. If the charging current is lower than the setting, the test cables may not be connected
properly. The instrument can set the Charge-LO parameter manually or automatically. To manually
set the Charge-LO current, use the
Please be aware that the program will activate high voltage on the output
connector while the TEST button is pressed.
The program will read the charging current of the DUT and set the Charge-LO current at
approximately one half (1/2) of the reading. The instrument will beep and the new value will
automatically be updated in the field. You do not need to press the ENTER key for the new
parameter to be accepted.
Continuity
The Continuity test is generally used to test the ground conductor of a line cord. If the resistance
exceeds Max-Lmt trip point or drops below the Min-Lmt trip point the SE will signal a continuity
failure. If you are testing products with two prong plugs, do not activate the continuity circuit.
Offset
This function allows the instrument to compensate for lead and test fixture resistance during a
Continuity test
To manually set an Offset value enter a mΩ value via the numeric keypad and then press the
ENTER key to accept the new value or press the EXIT key to escape from the edit.
To automatically set an Offset value, set the output voltage, current, and frequency to the values
that will be used on the DUT and connect the test cables, test fixture, or Scanner channel with
fixturing to the instrument. Next, short the ends of the test cables and press the TEST button. The
instrument will beep and the new value will automatically be updated in the field. You do not need
to press the ENTER key for the new parameter to be accepted.
NOTE: do not connect the DUT to the instrument when performing an offset. This will create
erroneous results when a test is performed.
Setup Tests
This section of the manual details how to setup a test sequence.
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