The Scan function sequentially scans up to 100 channels
and grades the resistance of the DUT on each channel to
a reference value. An automated handler or test fixture is
required to interface the DUTs to the measurement
terminals and the scan interface that controls the timing
of each scan.
Note: The automated handler/test fixture is
user-supplied. Please see your distributor for support and
technical details.
Grading of each DUT is essentially the same as the
compare function (page 41), the difference being the
Scan function will compare up to 100 DUTs sequentially,
whereas the Compare function will compare only one
DUT at a time.
The scan function compares a measured value to a
“Reference” value that has an upper (HI) and lower (LO)
limit. If the measured value is within the upper and lower
limit, then the measured value is judged as IN.
There are two modes that can be used to make a
judgment: ABS and △% modes.
The ABS mode compares the measured value to the
upper (HI) and lower (LO) limits. The upper and lower
limits are set as absolute resistance values.
The △% compare function compares the deviation of
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