Hyd-Mech S20DSP - Page 26

3--10
20
Use and maintenance manual S20DSP
Emissions
CONDUCTED EMISSIONS
Gate A Freq. (MHz) Q --- p e a k l i m i t ( d B u V ) Mean value limit (dBuV) Result
A.C. power supply
input
0.15 --- 0.5
0 . 5 --- 5
5 --- 3 0
79 --- 73
(linear reduction with
log of frequency)
73
73
66 --- 60
(linear reduction with log of fre-
quency)
60
60
Compli es
IRRADIATED EMISSIONS
Gate Freq. (MHz) Q--- peak limit (10 m)
(dBuV/m)
Result
Enclosure 30 --- 230
230 --- 1000
40
47
Compli es
Immunity
IMMUNITY TO ELECTROSTATIC DISCHARGES
Gate Test levels Evaluation criterion Result
Enclosure contact 4 kV
steel plate 4 kV
in air 8 kV
B Compli es
IMMUNITY TO VOLTAGE (BURSTS)
Gate Test levels Evaluation criterion Result
A.C. power supply in-
put
2kV B Compli es
IMMUNITY TO HIGH VOLTAGE PULSES (Surge)
Gate Test levels Evaluation criterion Result
A.C. power supply in-
put
1 kV (Phase --- phase)
2 k V ( P h a s e --- e a r t h )
B Compli es
IMMUNITY TO DIPS AND SHORT VOLTAGE INTERRUPTIONS (PQT)
Gate Test levels Evaluation criterion Result
A.C. power supply in- 70% per 0.5 periods B Compli es
p
p
p
y
put
0% per 0.5 periods
40% per 5 periods
40% per 50 perio ds
B
p
IMMUNITY TO CONDUCTED ELECTROMAGNETIC FIELDS
Gate Test levels Evaluation criterion Result
A.C. power supply in-
put
10V A Complies
IMMUNITY TO IRRA DIATED ELECTROMAGNETIC FIELDS
Gate Test levels Evaluation criterion Result
Enclosure 10 V/m A Complies