Built-In Test documentation
The following paragraphs provide a detailed description of each Built-In Test. Refer to
“Built-In Test overview” for basic information on how to use Built-In Tests. The following doc-
umentation is provided for each test:
• Test Identification — Includes test bank, number and name.
• Input Requirements — Indicates the required state of the input terminals for the test.
Note that input requirements are displayed by the Model 2000 when Built-In Test is run.
• Expected Value and Limits — Provides the measurement or reading value (and limits)
that is expected for the test as explained in the “Description”.
• Fault Message — For pass/fail type tests, a message is provided to summarize the cause
of the failure.
• Description — Provides a description of circuit being tested. In general, all components
in the tested circuit could be the cause of a failure.
• Bit Patterns — Provides the logic states of key shift registers. After a test is manually
run, you can check the registers for the correct logic levels.
NOTE The letter “v” in a bit pattern indicates a “don’t care” condition.
2-22 Troubleshooting
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