2400 Series SourceMeter
®
User’s Manual Limit Testing 12-3
Pass/fail information
Pass/fail information for limit tests can be obtained as follows:
•A PASS or FAIL indication on the front panel display.
• By programming the unit to output specific pass/fail bit patterns on the Digital I/O
port, which can be used to control other equipment such as a device handler for
binning operations. See “Binning systems,” page 12-11, and Section 13,
“Digital I/O port,” for more information.
•With the :CALCulate2:LIMit<n>:FAIL? query via remote, where <n> is the limit
test number (Section 18, “CALCulate2”).
• By reading various status bits (Section 15, “Status Structure,” and Section 18,
“FORMat subsystem”).
• By noting a “P” or “F” preceding buffer location numbers (Section 9, “Recalling
readings”).
Data flow
All limit tests are part of the CALC2 data block. See Appendix C for an overview on how
limit testing fits into the overall data flow through the SourceMeter.
Limit 1 test (compliance)
This hardware (H/W) test checks the compliance state of the SourceMeter. It uses the pro-
grammed compliance as the test limit. At or above the programmed limit, the instrument is
in compliance. Below the limit, the instrument is not in compliance.
For example, assume you want to pass resistors that are below 1kΩ. To do this, set the
I-Source to output 1mA at a compliance limit of 1V, and configure the test to fail on com-
pliance. If, for example, the resistor under test is 750Ω, output voltage will be 0.75V
(1mA × 750Ω = 0.75V). Since the output voltage is below the 1V limit, the test passes. If
the resistor is 1kΩ (or more), output voltage will be 1V (1mA × 1kΩ = 1V). Since the 1V
limit is reached, which places the SourceMeter in compliance, the test fails.
The Limit 1 test can be used to determine the polarity of a device, such as a diode. By
using this test with a source memory sweep, you can branch to a different setup at a speci-
fied memory location when the device is installed backwards. See the programming exam-
ple at the end of this section for details on diode testing.
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