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Type | Semiconductor Characterization System |
---|---|
Category | Measuring Instruments |
Model | 4200A-SCS |
Manufacturer | Keithley |
Number of Channels | Up to 9 |
Number of SMUs | Up to 9 |
Supported Measurements | CV |
Display | Touchscreen GUI |
Connectivity | LAN, USB, GPIB |
Software | Clarius |
Details RPM connections to DUT, including local and remote sensing configurations.
Describes how to correct measurement errors caused by connections and cable length.
Explains LLEC for PMU to compensate for voltage variations due to DUT resistance.
Provides steps to diagnose and resolve issues with pulse I-V test results.
Explains how to execute configured tests and analyze the obtained results.
Details configuring, running, and analyzing pulsed I-V measurements on MOSFETs.
Describes endurance and disturb testing procedures for flash memory devices.