Keithley 4200A-SCS User Manual

Section 4: Pulse card concepts Model 4200A-SCS Pulse Card (PGU and PMU) User's Manual
4-24 4200A-PMU-900-01 Rev. A December 2020
Spot mean measurements
Spot mean measurements sample a portion of the amplitude and a portion of the base level (see
Spot mean measurement timing (on page 4-27)). The portions to be sampled are specified as a
percentage. Note that you can return an individual spot mean for each pulse (see Spot mean discrete
readings (on page 4-24)), or have a single spot mean for all NumPulses (see Spot mean average
readings (on page 4-25)).
If you enable both amplitude and base spot means, each pulse has two voltage measurements and
two current measurements (see pulse_fetch).
Spot mean discrete readings
The averaged voltage and current readings for every sampled pulse period are returned in a single
data set. The figure below shows how spot mean discrete readings are returned as a data set for two
pulse periods. With all voltage and current readings enabled, four readings are returned for each
pulse. The measured samples are averaged to yield the mean average readings. When time stamps
are enabled, a time stamp is included in the data set after each mean reading.
Figure 93: Returned data set for spot mean discrete readings

Keithley 4200A-SCS Specifications

General

Type	Semiconductor Characterization System
Category	Measuring Instruments
Model	4200A-SCS
Manufacturer	Keithley
Number of Channels	Up to 9
Number of SMUs	Up to 9
Supported Measurements	CV
Display	Touchscreen GUI
Connectivity	LAN, USB, GPIB
Software	Clarius

Summary

Connections and Cabling

RPM Connections and Sensing

Details RPM connections to DUT, including local and remote sensing configurations.

PMU Connection Compensation

Describes how to correct measurement errors caused by connections and cable length.

Load-Line Effect Compensation (LLEC)

Explains LLEC for PMU to compensate for voltage variations due to DUT resistance.

Setting Up PMUs and PGUs in Clarius

Project and Test Configuration

PMU Operation and Measurement Modes

Basic Troubleshooting Procedure

Provides steps to diagnose and resolve issues with pulse I-V test results.

KPulse Software Application

Standard and Segment Arb Waveforms

Custom File Arb Waveforms

Using the RPM for Switching and Measurements

RPM Configuration and Connections

Set Up the Measurements in Clarius

Run and Analyze Test Results

Explains how to execute configured tests and analyze the obtained results.

PMU for Pulsed I-V on MOSFETs

Equipment and Connection Schematic

Configure, Run, and Analyze MOSFET Tests

Details configuring, running, and analyzing pulsed I-V measurements on MOSFETs.

Testing Flash Memory

Flash Connection Guidelines and Operations

Endurance and Disturb Testing

Describes endurance and disturb testing procedures for flash memory devices.

Using KPulse for Flash Waveforms