Keithley 4200A-SCS - PMU for Pulsed I-V on MOSFETs

In this section:
Introduction .............................................................................. 7-1
Equipment required .................................................................. 7-2
Device connections .................................................................. 7-2
Set up the measurements in Clarius ........................................ 7-4
Introduction
You can use the Model 4225-PMU Ultra-Fast Module to make both pulsed I-V measurements and
transient I-V measurements (waveform capture) on a device.
Pulsed I-V refers to a test with a pulsed voltage source and a corresponding high speed, time-based
current measurement that provides dc-like results. You can define the parameters of the pulse,
including the pulse width, duty cycle, rise/fall times, and amplitude.
Transient I-V, or waveform capture, is a time-based current and/or voltage measurement that is
typically the capture of a pulsed waveform. Transient I-V measurements can be used to test a
dynamic test circuit or as a diagnostic tool for choosing the appropriate pulse settings in the pulsed
I-V mode.
This section provides an example of how to use the 4225-PMU and the optional Model 4225-RPM
Remote Preamplifier/Switch Module to make a pulsed I-V measurement on a MOSFET. The example
explains how to set up a pulsed voltage step applied to the gate terminal using PMU1 channel 1 and
a pulsed voltage sweep to the drain terminal using PMU1 channel 2. The drain current is measured
as a function of the drain voltage and displayed in the graph in the Analyze pane.
Section 7
PMU for pulsed I-V measurements on a MOSFET