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Lexicon LXP-5 Service Manual

Lexicon LXP-5
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Performance
Verification
Lexicon
Test
Programs,
cont’d.
Slave
Reset
test
(User
6:3J
Slave
Communications
test
(User
6:
4
)
Slave
Interrupt
test
(User
6:
5;
Slave
RAM
test
(User
6:
6
)
Master
WCS
test
(User
6:
7)
Slave
WCS
test
(User
6:8J
DRAM
test
(User
7)
This
test
checks
the
ability
of
the
master
processor
to
put
the
slave
processor
in
reset
mode.
This
test
requires
the
master
processor
to
send
a
program
to
the
slave
processor
while
holding
it
in
reset.
The
program
instructs
the
slave
processor
to
load
a
message
into
a
specific
area
of
memory
upon
removal
of
reset.
After
removing
reset,
the
master
processor
checks
to
see
if
the
message
is
in
memory.
If
this
test
fails,
check
the
Master/Slave
interface
and
the
Master
I/O
decoding
signal.
Run
all
other
Slave
tests
to
further
isolate
the
problem.
This
test
checks
the
ability
of
the
master
and
slave
to
communicate
with
each
other
using
shared
memory
space.
Failure
indicates
a
problem
with
the
Slave
Decoder,
or
the
Master/Slave
interface.
Run
all
other
Slave
tests
to
further
isolate
the
problem.
This
test
checks
the
ability
of
the
master
processor
to
send
interrupts
to
the
slave
processor.
A
program
is
sent
to
the
slave
processor
from
the
master
which
tells
the
slave
to
load
a
message
into
a
specific
area
of
memory
upon
receipt
of
an
interrupt.
The
master
processor
then
sends
an
interrupt,
and
checks
for
the
message
in
memory.
Failure
indicates
a
problem
in
the
Master
Decoder
(U11),
or
SINT
signal
hardware.
Run
all
other
Slave
tests
to
further
isolate
the
problem.
This
test
checks
the
area
of
volatile
RAM
used
by
the
Slave
Processor.
This
test
consists
of
storing
and
reading
various
values
in
RAM
by
the
Slave
Processor.
This
test
can
be
used
to
help
isolate
Slave
RAM
problems
by
determining
if
a
Slave
RAM
problem
is
caused
by
RAM,
Master/Slave
interface,
or
Slave
Processor
problems.
Notethat
only
the
upper
4K
of
RAM
is
exercised
in
this
test.
This
test
performs
a
RAM
test
on
the
WCS
portion
of
the
Lexichip
by
the
master
processor.
Failure
indicates
possible
Lexichip
problems.
This
test
should
be
run
in
conjunction
with
the
Slave
WCS
and
Master
Address
tests
to
eliminate
Master/Slave
interface
problems,
and
to
isolate
Lexichip
WCS
errors.
This
test
performs
a
RAM
test
on
the
WCS
po
rtion
of
the
Lexichip
by
the
slave
processor.
Failure
of
this
test
and
the
Master
WCS
test
indicate
problems
with
Lexichip
WCS.
This
test
checks
the
DRAM
in
the
Lexichip
address
area.
The
duration
of
this
test
is
approximately
30
seconds,
after
which
the
results
are
displayed.
Failure
indicates
a
problem
with
Audio
Memory
(U22,23,29,30).
Faulty
WCS
will
also
cause
this
test
to
fail.
2-8

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Lexicon LXP-5 Specifications

General IconGeneral
BrandLexicon
ModelLXP-5
CategoryRecording Equipment
LanguageEnglish

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