Metrohm FOSS NIRS XDS MultiVial Analyzer User Manual

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The XDS instrument contains internal wavelength reference materials, which are used as a means to
maintain monochromator wavelength measurement. These internal wavelength materials are
protected and are moved by software command, transparent to the user. When Performance Test is
run, the relative wavelength positions and repeatability of these wavelength materials are monitored
and reported.
Note that these internal wavelength materials need not be precisely on the assigned nominals. These
nominals are arbitrary. The internal wavelength materials are a method to assure stable readings on
the external wavelength standard, measured at the sample plane.
7.2.2 Wavelength Certification
Wavelength Certification is used to confirm the peak positions of the instrument to a defined,
external wavelength standard.
Click on Diagnostics,
Wavelength Certification,
Run Wavelength
Certification.
The Number of Samples should be 10, as
shown. The wavelength standard for
reflectance is the “SRM-1920 plus talc”, which
refers to the WSR1xxxx standard. This is the
same cell used for Instrument Calibration.
Click “OK” when ready.
Vision briefly requests that the user place the ceramic reference into position. This is automatic
with the MultiVial Analyzer; no response is required.
When the reference scan is finished, insert the
wavelength standard as directed.
Always place the standard into the instrument in
the same orientation, with the label parallel to
the long axis of the tray.
Click “OK” when ready.
After the test is complete, a spectrum of the standard is shown in the upper right quadrant of the

Metrohm FOSS NIRS XDS MultiVial Analyzer Specifications

General

Brand	Metrohm
Model	FOSS NIRS XDS MultiVial Analyzer
Category	Measuring Instruments
Language	English