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NXP Semiconductors MPC5777M - Page 71

NXP Semiconductors MPC5777M
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Address decoding coverage
Safety Manual for MPC5777M, Rev. 1.1
NXP Semiconductors 71
All locations listed in Table 10 should be read to perform the self-test. To minimize the testing time, the
pattern can be optimized by reducing the number of locations to be read.
Table 9. All combinations of DecC and DecD considered
DecE
DecD DecC DecB DecA 000 001 010 011 100 101 110 111 Description
000 10 11 00
DecD combination
001 10 11 00
DecD combination
010 10 11 00
DecD combination
011 10 01 00 DecB combination
011 10 11 00 DecB combination
011 00 11 00
DecC combination
011 01 11 00
DecC combination
011 10 11 00
Ah : victim address (red cell)
011 11 11 00
DecC combination
011 10 11 01 DecA combination
011 10 11 10 DecA combination
011 10 11 11 DecA combination
100 01 00 11 Complementary address
100 10 11 00
DecD combination
101 10 11 00
DecD combination
110 10 11 00
DecD combination
111 10 11 00
DecD combination
Table 10. All cells should be read
DecE
DecD DecC DecB DecA 000 001 010 011 100 101 110 111 Description
000 10 11 00 DecD combination
001 10 11 00 DecD combination
010 10 11 00 DecD combination
011 10 01 00 DecB combination
011 10 11 00 DecB combination
011 00 11 00 DecC combination
011 01 11 00 DecC combination
011 10 11 00
Ah : victim address (red cell)

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