NXP Semiconductors S32R274 - Test Points - Daughter Card

Configuration – Daughter card
S32R274/372 EVB User Guide, Rev. 0, 08/2018
24 NXP Semiconductors
4.10. Test points - daughter card
Daughter card test points are listed and detailed in the table below.
Table 11. Test points – daughter card
Signal
TP
name
Shape
Description
VREG_SWP
TP1
Test Loop
Driver signal for
external switching
transistor
3V3_HV_REG
TP2
Test Loop
3V3 Supply to external
transistor
VREG_I-SENSE
TP3
Test Loop
Current sense analog
input
3V3_PGOOD
TP4
Surface Pad
Power good signal from
3.3v linear regulator
4V2_PGOOD
TP5
Surface Pad
Power good signal from
4.2v switching regulator
4V2_SW_REG
TP6
Surface Pad
4.2V Switching regulator
output
1V2_LR_HV
TP7
Surface Pad
1.2V Ethernet phy
regulator output
1.25V_SR_LDO
TP8
Surface Pad
1.25V Core supply
VDD_LV_RADARDIG
TP9
Surface Pad
1.4V RADAR Reference
VDD_LV_RADARREF
TP10
Surface Pad
1.4V RADAR Reference
VDD_HV_RAW
TP11
Surface Pad
Analog supply for 1.4v
on chip regulators
VDD_HV_DAC
TP12
Surface Pad
3.3V Analog supply for
DAC
VDD_HV_DAC_2V5
TP13
Surface Pad
2.5V supply voltage for
DAC
AFE_FILTER
TP14
Surface Pad
AFE filter
GND
TP28,
TP29
Test Loop
Ground
ETIMER2_ETC0
TP30
Test Loop
Etimer 2 Channel 0
NPC_EVTO_B
TP31
Test Loop
PI9 (Pad G14)
VDD_LV_SDPLL
TP32
Surface Pad
1.4V Analog supply for
320Mhz PLL
VDD_LV_SDADC
TP33
Surface Pad
1.4V analog supply for
SD ADCs
VDD_LV_OSC
TP34
Surface Pad
1.4V analog supply for
crystal oscillator
ENET_REF_CLK
TP35
Test Loop
125MHz ENET
Reference clock